Back To: Home

CLICK HERE FOR WHAT'S NEW IN:
 




 

New Apreo SEM provides high-resolution surface information with excellent contrast
June 2016
SHARING OPTIONS:

FEI Company
 
The new Apreo scanning electron microscope (SEM) offers exceptional versatility for life-sciences research. Due to its proprietary compound final lens design, the Apreo SEM is capable of resolution down to 1.0 nm at 1 kV without the need for beam deceleration, providing high performance on nearly any sample, even if it is tilted or topographic. It offers backscatter detection at the lowest beam currents, at any tilt angle, on sensitive samples and at TV-rate imaging, so materials contrast is strong.
 
The Apreo software provides user guidance and “point-and-click” navigation using an in-chamber camera, making it easy for even novice users to get excellent results.
 
FEI Company
www.fei.com/apreo

Back



PAGE UTILITIES


CONTACT US
DDNEWS
Published by Old River Publications LLC
19035 Old Detroit Road
Rocky River, OH USA 44116
Ph: 440-331-6600  |  Fax: 440-331-7563
 
© Copyright 2017 Old River Publications LLC. All righs reserved.  |  Web site managed and designed by OffWhite.